Item Details

Testing, Reliability, and Application of Micro- and Nano-Material Systems [electronic resource]: 3-5 March, 2003, San Diego, California, USA

Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; cosponsored by National Institute of Standards and Technology (USA) ... [et al.] ; cooperating organizations, Institute of Acostic Microscopy (USA) ... [et al.] ; published by SPIE--the International Society for Optical Engineering
Format
EBook; Book; Online
Published
Bellingham, Wash. : SPIE, c2003.
Language
English
Series
SPIE Proceedings Series
Proceedings of SPIE — the International Society for Optical Engineering
ISBN
0819448508
Description
Mode of access: World wide Web.
Notes
Includes bibliographical references and author index.
Series Statement
SPIE proceedings series, 0277-786X ; v. 5045
Proceedings of SPIE--the International Society for Optical Engineering ; v. 5045
Logo for Copyright Not EvaluatedCopyright Not Evaluated
Technical Details
  • Access in Virgo Classic

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