Item Details

Surface Scattering and Diffraction for Advanced Metrology II [electronic resource]: 9 July, 2002, Seattle, Washington, USA

Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company ... [et al.]
Format
EBook; Book; Online
Published
Bellingham, Washington : SPIE, c2002.
Language
English
Series
SPIE Proceedings Series
Proceedings of SPIE — the International Society for Optical Engineering
ISBN
0819445479
Description
Mode of access: World wide Web.
Notes
Includes bibliographic references and author index.
Series Statement
SPIE proceedings series ; v. 4780
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4780
Logo for Copyright Not EvaluatedCopyright Not Evaluated
Technical Details
  • Access in Virgo Classic

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