Item Details

Optical Metrology and Inspection for Industrial Applications [electronic resource]: 18-20 October 2010

Kevin Harding, Peisen S. Huang, Toru Yoshizawa, editors ; sponsored by SPIE [and] COS--Chinese Optical Society ; cooperating organizations, Beijing Institute of Technology (China) ... [et al.] ; supporting organizations, China Association for Science and Technology (China), National Nature Science Foundation (China), [and] the Ministry of Scienc...
Format
EBook; Book; Online
Published
Bellingham, Wash. : SPIE, c2010.
Language
English
Series
Proceedings of SPIE
Proceedings of SPIE — the International Society for Optical Engineering
ISBN
9780819483850 (pbk.), 0819483850 (pbk.)
Description
Mode of access: World wide Web.
Notes
Includes bibliographical references and author index.
Series Statement
Proceedings of SPIE ; v. 7855
Proceedings of SPIE--the International Society for Optical Engineering ; v. 7855
Logo for Copyright Not EvaluatedCopyright Not Evaluated
Technical Details
  • Access in Virgo Classic

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