Item Details

Damage to VUV, EUV, and X-Ray Optics III [electronic resource]: 18-19 April 2011, Prague, Czech Republic

Libor Juha, Saša Bajt, Richard A. London, editors ; sponsored and published by SPIE ; cooperating organizations, ELI Beamlines, HiPER
Format
EBook; Book; Online
Published
Bellingham, Wash. : SPIE, 2011.
Language
English
Series
Proceedings of SPIE
Proceedings of SPIE — the International Society for Optical Engineering
ISBN
0819486671, 9780819486677
Description
Mode of access: World wide Web.
Notes
Includes bibliographical references and author index.
Series Statement
Proceedings of SPIE, 0277-786X ; v. 8077
Proceedings of SPIE--the International Society for Optical Engineering ; v. 8077
Logo for Copyright Not EvaluatedCopyright Not Evaluated
Technical Details
  • Access in Virgo Classic

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