Item Details

2009 International Conference on Optical Instruments and Technology [electronic resource]: Optoelectronic Measurement Technology and Systems : 19-22 October 2009, Shanghai, China

Shenghua Ye, Guangjun Zhang, Jun Ni, editors ; sponsored by CIS--China Instrument and Control Society, COS--the Chinese Optical Society [and] SPIE ; cooperating organizations, Optoelectronic-Mechanic Technology and System Integration Chapter, CIS (China) ... [et al.]
Format
EBook; Book; Online
Published
Bellingham, Wash. : SPIE, c2009.
Language
English
Variant Title
Optoelectronic measurement technology and systems
International Conference on Optical Instruments and Technology
Series
Proceedings of SPIE
Proceedings of SPIE — the International Society for Optical Engineering
ISBN
9780819478979, 0819478970
Description
Mode of access: World wide Web.
Notes
Includes bibliographical references and author index.
Series Statement
Proceedings of SPIE, 0277-786X ; v. 7511
Proceedings of SPIE--the International Society for Optical Engineering ; v. 7511
Logo for Copyright Not EvaluatedCopyright Not Evaluated
Technical Details
  • Access in Virgo Classic

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