Item Details

Print View

Secondary Ion Mass Spectrometry [electronic resource]: An Introduction to Principles and Practices

P.A.W. van der Heide
Format
EBook; Book; Online
Published
Hoboken, New Jersey : Wiley, [2014]
Language
English
ISBN
9781118916773 (epub), 9781118916766 (pdf), 9781118480489 (hardback)
Summary
"This is presented in a concise yet comprehensive manner to those wanting to know more about the technique in general as opposed to advanced sample specific procedures/applications"--
Contents
Machine generated contents note: Forward x Preface xi Acknowledgements xiv List of physical constants xiv Chapter 1: Introduction 1.1 Matter and the Mass Spectrometer 1.2 Secondary Ion Mass Spectrometry 1.3 Summary Section I Chapter 2: Properties of atoms, ions, molecules and solids 2.1 The Atom 2.2 Electronic structure of atoms and ions 2.3 Summary Chapter 3: Current understanding of sputtering and ion formation 3.1 The fundamentals of SIMS 3.2 Sputtering 3.3 Ionization/neutralization 3.4 Summary Section II Chapter 4: Instrumentation 4.1 The science of measurement 4.2 Hardware 4.3 Summary Chapter 5: Data collection 5.1 The art of measurement 5.2 Sample preparation and handling 5.3 Data collection 5.4 Data conversion 5.5 Summary Appendix i) Periodic table of the elements ii) Isotope masses, natural isotope abundances, atomic weights and mass densities of the elements iii) 1st and 2nd Ionization potentials and electron affinities of the elements iv) Work-functions of elemental solids v) SIMS detection limits of selected elements vi) Charged particle beam transport vii) Statistical properties viii) SIMS instrument designs ix) Additional SIMS methods of interest x) Additional spectrometric/spectroscopic techniques xi) Additional microscopic techniques xii) Diffraction / reflection techniques Technique acronym list Abbreviations commonly used in SIMS Glossary of terms Questions and answers References Index Notes .
Description
Mode of access: World wide Web.
Notes
Includes bibliographical references and index.
Copyright Not EvaluatedCopyright Not Evaluated
Technical Details
  • Access in Virgo Classic
  • Staff View

    LEADER 03240cam a2200409 i 4500
    001 u6701297
    003 SIRSI
    005 20171108061339.0
    006 m d
    007 cr n
    008 140505s2014 nju sb 001 0 eng d
    010
      
      
    a| 2014017866
    020
      
      
    a| 9781118916773 (epub)
    020
      
      
    a| 9781118916766 (pdf)
    020
      
      
    z| 9781118480489 (hardback)
    035
      
      
    a| (WaSeSS)ssj0001292790
    040
      
      
    a| DLC b| eng c| DLC d| DLC d| WaSeSS
    042
      
      
    a| pcc
    050
      
    0
    a| QD96.S43
    082
    0
    0
    a| 543/.65 2| 23
    084
      
      
    a| SCI013010 2| bisacsh
    100
    1
      
    a| Van der Heide, Paul, d| 1962-
    245
    1
    0
    a| Secondary ion mass spectrometry h| [electronic resource] : b| an introduction to principles and practices / c| P.A.W. van der Heide.
    260
      
      
    a| Hoboken, New Jersey : b| Wiley, c| [2014]
    504
      
      
    a| Includes bibliographical references and index.
    505
    8
      
    a| Machine generated contents note: Forward x Preface xi Acknowledgements xiv List of physical constants xiv Chapter 1: Introduction 1.1 Matter and the Mass Spectrometer 1.2 Secondary Ion Mass Spectrometry 1.3 Summary Section I Chapter 2: Properties of atoms, ions, molecules and solids 2.1 The Atom 2.2 Electronic structure of atoms and ions 2.3 Summary Chapter 3: Current understanding of sputtering and ion formation 3.1 The fundamentals of SIMS 3.2 Sputtering 3.3 Ionization/neutralization 3.4 Summary Section II Chapter 4: Instrumentation 4.1 The science of measurement 4.2 Hardware 4.3 Summary Chapter 5: Data collection 5.1 The art of measurement 5.2 Sample preparation and handling 5.3 Data collection 5.4 Data conversion 5.5 Summary Appendix i) Periodic table of the elements ii) Isotope masses, natural isotope abundances, atomic weights and mass densities of the elements iii) 1st and 2nd Ionization potentials and electron affinities of the elements iv) Work-functions of elemental solids v) SIMS detection limits of selected elements vi) Charged particle beam transport vii) Statistical properties viii) SIMS instrument designs ix) Additional SIMS methods of interest x) Additional spectrometric/spectroscopic techniques xi) Additional microscopic techniques xii) Diffraction / reflection techniques Technique acronym list Abbreviations commonly used in SIMS Glossary of terms Questions and answers References Index Notes .
    520
      
      
    a| "This is presented in a concise yet comprehensive manner to those wanting to know more about the technique in general as opposed to advanced sample specific procedures/applications"-- c| Provided by publisher.
    538
      
      
    a| Mode of access: World wide Web.
    650
      
    0
    a| Secondary ion mass spectrometry.
    655
      
    0
    a| Electronic books.
    710
    2
      
    a| Ebook Central - Academic Complete
    710
    2
      
    a| Wiley Online Library UBCM All Obooks
    776
    0
    8
    i| Print version: a| Van der Heide, Paul, 1962- author. t| Secondary ion mass spectrometry d| Hoboken, New Jersey : John Wiley & Sons, Inc., [2014] z| 9781118480489 w| (DLC) 2014011448
    856
    4
    0
    u| http://RE5QY4SB7X.search.serialssolutions.com/?V=1.0&L=RE5QY4SB7X&S=JCs&C=TC0001292790&T=marc
    596
      
      
    a| 1
    999
      
      
    a| XX(6701297.1) w| WEB i| 6701297-1001 l| INTERNET m| UVA-LIB t| INTERNET
▾See more
▴See less

Availability

Google Preview

Google Books Preview

Read Online