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Microprobe Characterization of Optoelectronic Materials

edited by Juan Jiménez
Format
Book
Published
New York : Taylor & Francis, [2003]
Language
English
Series
Optoelectronic Properties of Semiconductors and Superlattices
ISBN
1560329416, 9781560329411
Related Resources
Table of contents Publisher description
Contents
  • Photoluminescence imaging / M. Baeumler and W. Jantz
  • Micro-raman spectroscopy of semiconductors / J. Jiménez, I. de Wolf, and J.P. Landesman
  • Near-field scanning optical microscopy of semiconductor nanostructures / C. Lienau
  • Cross-sectional scanning tunneling microscopy studies of heterostructures / N.D. Jäger, E.R. Weber, and M. Salmerón
  • Application of transmission electron microscopy to study interfaces in optoelectronic materials / Z. Liliental-Weber
  • Electron-beam-induced luminescence studies of low-dimensional semiconductor structures / A. Gustafsson and L. Samuelson
  • X-ray topography / M. Dudley and X.R. Huang
  • Selective etching and complementary microprobe techniques / J.L. Weyher, C. Frigeri, and S. Muller.
Description
xiv, 715 pages : illustrations ; 24 cm.
Notes
Includes bibliographical references and index.
Series Statement
Optoelectronic properties of semiconductors and superlattices ; v. 17
Technical Details
  • Access in Virgo Classic
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