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Stress-Induced Phenomena in Metallization [electronic resource]: Seventh International Workshop on Stress-Induced Phenomena in Metallization, Austin, Texas, 14-16 June 2004

editors, Paul S. Ho ... [et al.]
Format
EBook; Book; Online
Published
Melville, N.Y. : American Institute of Physics, 2004.
Language
English
Variant Title
Stress induced phenomena in metallization
Series
AIP Conference Proceedings
ISBN
0735402256
Contents
  • Fracture and reliability for low k dielectrics
  • Electromigration
  • Thermal stresses and void formation.
Description
Mode of access: World wide Web.
Notes
  • "Held at the University of Texas at Austin"--Pref.
  • Includes bibliographical references and indexes.
Series Statement
AIP conference proceedings, 0094-243X ; v. 741
AIP conference proceedings no. 741
Copyright Not EvaluatedCopyright Not Evaluated
Technical Details
  • Access in Virgo Classic
  • Staff View

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    a| Semiconductors x| Defects v| Congresses.
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