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Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy

edited by David Briggs and John T. Grant
Format
Book
Published
Chichester : IM Publications, c2003.
Language
English
ISBN
1901019047, 9781901019049
Related Resources
Table of contents
Contents
  • Perspectives and basic principles
  • Sample handling, instrumentation and beam effects
  • Surface sensitivity
  • Quantification
  • Spectral interpretation
  • Structural effects
  • Depth profiling
  • Imaging
  • Developing aspects.
Description
xi, 899 p. : ill. (some col.), ports. ; 26 cm.
Notes
  • Published by IM Publications and SurfaceSpectra Limited.
  • Includes bibliographical references and index.
Technical Details
  • Access in Virgo Classic
  • Staff View

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    a| xi, 899 p. : b| ill. (some col.), ports. ; c| 26 cm.
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    a| Published by IM Publications and SurfaceSpectra Limited.
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    a| Perspectives and basic principles -- Sample handling, instrumentation and beam effects -- Surface sensitivity -- Quantification -- Spectral interpretation -- Structural effects -- Depth profiling -- Imaging -- Developing aspects.
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    a| Surfaces (Technology) x| Analysis.
    650
      
    0
    a| Electron spectroscopy.
    650
    0
    7
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    650
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    7
    a| Oberflächenanalyse. 2| swd
    650
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    a| Röntgen-Photoelektronenspektroskopie. 2| swd
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