Item Details

Print View

Growth Kinetics, Electrical Characterization and Reliability Study of Sub-5 Nm Gate Dielectrics [electronic resource]

Tanya Nigam
Format
EBook; Thesis/Dissertation; Book; Online
Published
1999.
Language
English
Access Restriction
Available to Center for Research Libraries (CRL) members only. Consult CRL for membership information: http://www.crl.edu/content/members/memberListAlpha.asp
Description
1 online resource (181 p.)
Dissertation Note
Thesis (doctoral)--Katholieke Universiteit te Leuven (1970- ), 1999.
Copyright Not EvaluatedCopyright Not Evaluated
Technical Details
  • Access in Virgo Classic
  • Staff View

    LEADER 01358nam a2200301Ka 4500
    001 u5755734
    003 SIRSI
    005 20120514085444.0
    006 m o d
    007 cr |||||||||||
    008 120511s1999 be om 000 0 eng d
    035
      
      
    a| (OCoLC)793455211
    040
      
      
    a| CRL c| CRL
    049
      
      
    a| CRLL
    100
    1
      
    a| Nigam, Tanya.
    245
    1
    0
    a| Growth kinetics, electrical characterization and reliability study of Sub-5 nm gate dielectrics h| [electronic resource] / c| Tanya Nigam.
    260
      
      
    c| 1999.
    300
      
      
    a| 1 online resource (181 p.)
    502
      
      
    a| Thesis (doctoral)--Katholieke Universiteit te Leuven (1970- ), 1999.
    506
    1
      
    a| Available to Center for Research Libraries (CRL) members only. Consult CRL for membership information: u| http://www.crl.edu/content/members/memberListAlpha.asp
    710
    2
      
    a| Katholieke Universiteit te Leuven (1970- )
    776
    0
    8
    i| Print version: a| Nigam, Tanya. t| Growth kinetics, electrical characterization and reliability study of Sub-5 nm gate dielectrics. d| 1999 w| (OCoLC)310102540.
    856
    4
    0
    3| Center for Research Libraries u| http://proxy01.its.virginia.edu/login?url=https://dds.crl.edu/crldelivery/8539
    596
      
      
    a| 1
    999
      
      
    a| XX(5755734.1) w| WEB i| 5755734-1001 l| INTERNET m| UVA-LIB t| INTERNET
▾See more
▴See less

Availability

Google Preview

Google Books Preview