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Optical Radiation Measurement With Selected Detectors and Matched Electronic Circuits Between 200 Nm and 20 [Mu]m [microform]

George P. Eppeldauer, editor
Format
Book; Government Document; Microform
Published
Gaithersburg, Md. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, D.C. : For sale by the Supt. of Docs., U.S. G.P.O., [2001]
Language
English
Series
NIST Technical Note
SuDoc Number
C 13.46:1438
Description
x, 115 p. : ill. ; 28 cm.
Notes
  • "April 2001."
  • Shipping list no.: 2001-0361-M.
  • Includes bibliographical references.
Reproduction Notes
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2001 2 microfiches : negative.
Series Statement
NIST technical note ; 1438
Technical Details
  • Access in Virgo Classic
  • Staff View

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    a| Optical radiation measurement with selected detectors and matched electronic circuits between 200 nm and 20 [mu]m h| [microform] / c| George P. Eppeldauer, editor.
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    a| Microfiche. b| [Washington, D.C.] : c| Supt. of Docs., U.S. G.P.O., d| 2001 e| 2 microfiches : negative.
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    a| Optical radiometry x| Instruments.
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