Item Details

Embedded Digital System Reliability and Safety Analyses [microform]

prepared by L.M. Kaufman, B.W. Johnson
Format
Book; Government Document; Microform
Published
Washington, DC : Division of Engineering Technology, Office of Nuclear Regulatory Research, U.S. Nuclear Regulatory Commission, 2001.
Language
English
Series
NUREG/GR
SuDoc Number
Y 3.N 88:58/0020
Description
xi, 75 p. : ill. ; 28 cm.
Notes
  • "University of Virginia, Department of Electrical Engineering, Center for Safety-Critical Systems."
  • "Date published: February 2001."
  • Paper version no longer available for sale by the Supt. of Docs.
  • Shipping list no.: 2001-0340-M.
  • Includes bibliographical references (p. 68-73).
Reproduction Notes
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [2001] 1 microfiche : negative. s2001 dcun b
Series Statement
NUREG/GR ; 0020
Technical Details
  • Access in Virgo Classic

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    a| xi, 75 p. : b| ill. ; c| 28 cm.
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    a| Shipping list no.: 2001-0340-M.
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    a| Includes bibliographical references (p. 68-73).
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    a| Technical.
    533
      
      
    a| Microfiche. b| [Washington, D.C.] : c| Supt. of Docs., U.S. G.P.O., d| [2001] e| 1 microfiche : negative. 7| s2001 dcun b
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    a| Nuclear power plants x| Instruments x| Safety measures.
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    a| Johnson, B. W.
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