Item Details

Effectiveness of Binary Morphological Operators in Recognizing Defective Clusters on Silicon Wafers

Amin, Saiful
Format
Book
Published
2001.
Language
English
Notes
Systems Engineering
Technical Details
  • Access in Virgo Classic

  • LEADER 00441cam a2200145 4500
    001 u3733964
    003 SIRSI
    008 000000s2001 000 0 eng u
    100
      
      
    a| Amin, Saiful
    245
      
      
    a| Effectiveness of binary morphological operators in recognizing defective clusters on silicon wafers.
    260
      
      
    c| 2001.
    500
      
      
    a| Systems Engineering
    596
      
      
    a| 14
    999
      
      
    a| SE 200102 w| ALPHANUM i| X004381340 l| BY-REQUEST m| IVY t| THESIS-DIS

Availability

Library Location Map Availability Call Number
Ivy By Request N/A Available