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Particle Size Characterization [microform]

Ajit Jillavenkatesa, Stanley J. Dapkunas, Lin-Sien H. Lum
Format
EBook; Book; Government Document; Microform; Online
Published
[Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, D.C. : For sale by the Supt. of Docs., U.S. G.P.O., [2001]
Language
English
Series
NIST Special Publication
NIST Recommended Practice Guide
SuDoc Number
C 13.10:960-1
Description
v, 165 p. : ill. ; 23 cm.
Notes
  • "January 2001."
  • Shipping list no.: 2001-0333-M.
  • Includes bibliographical references.
Reproduction Notes
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2001. 2 microfiches : negative.
Series Statement
NIST special publication ; no. 960-1
Other Forms
Also available from the NIST website. Address as of 3/9/2005: http://www.msel.nist.gov/practiceguides/SP9601.pdf ; current access via PURL.
Copyright Not EvaluatedCopyright Not Evaluated
Technical Details
  • Access in Virgo Classic
  • Staff View

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    a| Particle size characterization h| [microform] / c| Ajit Jillavenkatesa, Stanley J. Dapkunas, Lin-Sien H. Lum.
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    a| v, 165 p. : b| ill. ; c| 23 cm.
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    a| NIST special publication ; v| no. 960-1
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    a| NIST recommended practice guide
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    a| "January 2001."
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    a| Shipping list no.: 2001-0333-M.
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    a| Includes bibliographical references.
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    a| Also available from the NIST website. Address as of 3/9/2005: http://www.msel.nist.gov/practiceguides/SP9601.pdf ; current access via PURL.
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    a| Microfiche. b| [Washington, D.C.] : c| Supt. of Docs., U.S. G.P.O., d| 2001. e| 2 microfiches : negative.
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