Item Details

Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

Michael L. Bushnell, Vishwani D. Agrawal
Format
Book
Published
Boston : Kluwer Academic, c2000.
Language
English
Series
Frontiers in Electronic Testing
ISBN
0792379918 (alk. paper)
Description
xviii, 690 p. : ill. ; 26 cm.
Notes
Includes bibliographical references (p. [621]-670) and index.
Technical Details
  • Access in Virgo Classic

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    a| Bushnell, Michael L. q| (Michael Lee), d| 1950-
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    a| Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / c| Michael L. Bushnell, Vishwani D. Agrawal.
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    a| Boston : b| Kluwer Academic, c| c2000.
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    a| xviii, 690 p. : b| ill. ; c| 26 cm.
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    a| Frontiers in electronic testing
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    a| Includes bibliographical references (p. [621]-670) and index.
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    a| Integrated circuits x| Very large scale integration x| Testing.
    650
      
    0
    a| Digital integrated circuits x| Testing.
    650
      
    0
    a| Mixed signal circuits x| Testing.
    650
      
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    a| Semiconductor storage devices x| Testing.
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    a| Agrawal, Vishwani D., d| 1943-
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    a| TK7874.75 .B87 2000 w| LC i| X004474743 l| STACKS m| SCI-ENG t| BOOK

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