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In Situ Real Time Characterization of Thin Films: Edited by Orlando Auciello, Alan R. Krauss

Auciello, Orlando; Krauss, Alan Robert
Format
Book
Published
New York : Wiley, c2001.
Language
English
ISBN
0471241415 (cloth : alk. paper)
Description
xi, 263 p. : ill. ; 25 cm.
Notes
  • "A Wiley-Interscience publication."
  • Includes bibliographical references.
Technical Details
  • Access in Virgo Classic
  • Staff View

    LEADER 01016pam a22003374a 4500
    001 u3681648
    003 SIRSI
    005 20001208102225.0
    008 000215s2001 nyua b 000 0 eng
    010
      
      
    a| 00025162
    020
      
      
    a| 0471241415 (cloth : alk. paper)
    035
      
      
    a| (Sirsi) i0471241415
    035
      
      
    a| (OCoLC)43552632
    040
      
      
    a| DLC c| DLC d| DLC
    042
      
      
    a| pcc
    049
      
      
    a| VA@H
    050
    0
    0
    a| QC176.83 b| .I5 2000
    082
    0
    0
    a| 530.4/275 2| 21
    090
      
      
    a| PHYS/QC176.83 b| .I5 2000
    245
    0
    0
    a| In situ real time characterization of thin films / b| edited by Orlando Auciello, Alan R. Krauss.
    260
      
      
    a| New York : b| Wiley, c| c2001.
    300
      
      
    a| xi, 263 p. : b| ill. ; c| 25 cm.
    500
      
      
    a| "A Wiley-Interscience publication."
    504
      
      
    a| Includes bibliographical references.
    596
      
      
    a| 9
    650
      
    0
    a| Thin films.
    700
    1
      
    a| Auciello, Orlando, d| 1945-
    700
    1
      
    a| Krauss, Alan Robert.
    999
      
      
    a| QC176.83 .I5 2000 w| LC i| X004478917 l| STACKS m| PHYSICS t| BOOK
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