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A Back Face Strain Compliance Expression for the Compact Tension Specimen [microform]

William T. Riddell and Robert S. Piascik
Format
Book; Government Document; Microform
Published
Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1998]
Language
English
Series
NASA/TM
NASA Technical Memorandum
SuDoc Number
NAS 1.15:208453
Description
1 v.
Notes
Shipping list no.: 99-0559-M.
Reproduction Notes
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1999] 1 microfiche.
Series Statement
NASA/TM ; 1998-208453
NASA technical memorandum 208453
Technical Details
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    a| A back face strain compliance expression for the compact tension specimen h| [microform] / c| William T. Riddell and Robert S. Piascik.
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    a| Hampton, Va. : b| National Aeronautics and Space Administration, Langley Research Center ; a| [Springfield, Va. : b| National Technical Information Service, distributor, c| 1998]
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    a| Stress intensity factors. 2| nasat
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    a| Crack propagation. 2| nasat
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    a| Tensile stress. 2| nasat
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