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Photoinduced Defects in Semiconductors

David Redfield and Richard H. Bube
Format
Book
Published
Cambridge ; New York : Cambridge University Press, 1996.
Language
English
Series
Cambridge Studies in Semiconductor Physics and Microelectronic Engineering
ISBN
0521461960 (hc)
Description
x, 217 p. : ill. ; 24 cm.
Notes
Includes bibliographical references (p. 201-214) and index.
Series Statement
Cambridge studies in semiconductor physics and microelectronic engineering ; 4
Technical Details
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    a| Semiconductors x| Defects.
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