Item Details

A Radiometric Analysis of Projected Sinusoidal Illumination for Opaque Surfaces

Holroyd, Michael; Lawrence, Jason; Zickler, Todd
Format
Report
Author
Holroyd, Michael
Lawrence, Jason
Zickler, Todd
Abstract
Shifted sinusoidal illumination patterns are useful for appearance capture because they simultane- ously separate local and non-local reflections and allow the recovery of surface geometry. Here we show that the same illumination patterns can be used to estimate the local surface reflectance (BRDF) as well, provided that an appropriate correction factor is applied. We derive a closed-form expression for this correction factor, validate it experimentally, and discuss its implications.
Language
English
Date Received
20121029
Published
University of Virginia, Department of Computer Science, 2010
Published Date
2010
Collection
Libra Open Repository
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