Item Details

Measuring Parameter Variation on an FPGA Using Ring Oscillators

Mukherjee, Anindo; Skadron, Kevin
Format
Report
Author
Mukherjee, Anindo
Skadron, Kevin
Abstract
As processor clock frequencies become faster, architecture-level design is becoming increasingly limited by factors such as on-chip variation. Parameter variation occurs in integrated circuits as the result of a variety of manufacturing and physical factors. In this paper, we examine the degree to which there is parameter variation on an FPGA. Data were gathered from a combinatorial logic device instantiated on the FPGA. We analyze these data with respect to variance, and provide a confidence interval for the variance and standard deviation.
Language
English
Date Received
20121029
Published
University of Virginia, Department of Computer Science, 2006
Published Date
2006
Collection
Libra Open Repository
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