Item Details

Dynamic-Scanning-Electron-Microscope Study of Friction and Wear

by William A. Brainard and Donald H. Buckley
Format
Book; Government Document; Online; EBook
Published
Washington, D.C. : National Aeronautics and Space Administration ; [Springfield, Va. : For sale by the National Technical Information Service], 1974.
Language
English
Series
NASA Technical Note
Description
22 p. : ill. ; 27 cm.
Mode of access: Internet.
Notes
  • Prepared at Lewis Research Center.
  • Cover title.
  • Includes bibliographical references (p. 8).
Series Statement
NASA technical note ; NASA TN D-7700
Logo for Copyright Not EvaluatedCopyright Not Evaluated
Technical Details

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    a| Dynamic-scanning-electron-microscope study of friction and wear / c| by William A. Brainard and Donald H. Buckley.
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    a| Prepared at Lewis Research Center.
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    a| Includes bibliographical references (p. 8).
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    a| Mode of access: Internet.
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    a| Friction x| Experiments x| Equipment and supplies.
    650
      
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    a| Mechanical wear x| Experiments x| Equipment and supplies.
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    a| Scanning electron microscopes.
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