Item Details

Adhesion and Transfer of Polytetrafluoroethylene to Tungsten Studied by Field Ion Microscopy

by William A. Brainard and Donald H. Buckley
Format
Book; Government Document; Online; EBook
Published
Washington, D.C. : National Aeronautics and Space Administration ; [Springfield, Va. : For sale by the National Technical Information Service], 1972.
Language
English
Series
NASA Technical Note
Description
19 p. : ill. ; 27 cm.
Mode of access: Internet.
Notes
  • Prepared at Lewis Research Center.
  • Cover title.
  • Bibliography: p. 8-9.
Series Statement
NASA technical note ; NASA TN D-6887
Logo for Copyright Not EvaluatedCopyright Not Evaluated
Technical Details

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    a| Adhesion and transfer of polytetrafluoroethylene to tungsten studied by field ion microscopy / c| by William A. Brainard and Donald H. Buckley.
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    a| Washington, D.C. : b| National Aeronautics and Space Administration ; a| [Springfield, Va. : b| For sale by the National Technical Information Service], c| 1972.
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    a| NASA technical note ; v| NASA TN D-6887
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    a| Prepared at Lewis Research Center.
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    a| Bibliography: p. 8-9.
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    a| Mode of access: Internet.
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    a| Field ion microscopes.
    650
      
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    a| Tungsten.
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    a| Fluoroethylene.
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    a| Adhesion x| Measurement.
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    a| Buckley, Donald H.
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