Item Details

Auger Electron Spectroscopy Study of Surface Segregation in the Binary Alloys Copper - 1 Atomic Percent Indium, Copper - 2 Atomic Percent Tin, and Iron - 6.55 Atomic Percent Silicon

by John Ferrante
Format
Book; Government Document; Online; EBook
Published
Washington, D.C. : National Aeronautics and Space Administration ; [Springfield, Va. : For sale by the National Technical Information Service], 1973.
Language
English
Series
NASA Technical Note
Description
20 p. : ill. ; 27 cm.
Mode of access: Internet.
Notes
  • Prepared at Lewis Research Center.
  • Cover title.
  • Bibliography: p. 12-13.
Series Statement
NASA technical note ; NASA TN D-6982
Logo for No Copyright - United StatesNo Copyright - United States
Technical Details

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    a| Auger electron spectroscopy study of surface segregation in the binary alloys copper - 1 atomic percent indium, copper - 2 atomic percent tin, and iron - 6.55 atomic percent silicon / c| by John Ferrante.
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    a| NASA technical note ; v| NASA TN D-6982
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    a| Bibliography: p. 12-13.
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    a| Mode of access: Internet.
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    a| Auger electron spectroscopy.
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    a| Segregation (Metallurgy)
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