Item Details

The Measurement and Analysis of Pilot Scanning and Control Behavior During Simulated Instrument Approaches

by David H. Weir and Richard H. Klein
Format
Book; Government Document; Online; EBook
Published
Washington, D.C. : National Aeronautics and Space Administration ; Springfield, VA : For sale by the Clearinghouse for Federal Scientific and Technical Information, 1970.
Language
English
Variant Title
NASA CR-1535
Series
NASA Contractor Report
Description
1 v. (various pagings) : ill. ; 27 cm.
Mode of access: Internet.
Notes
  • Prepared by Systems Technology, Inc., Hawthorne, Calif., for Ames Research Center under contract no. NAS 2-3746
  • "N70-29904."
  • Includes bibliographical references (p. 56-57).
Series Statement
NASA contractor report ; 1535
Logo for No Copyright - United StatesNo Copyright - United States
Technical Details

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