Item Details

Mass Spectrometer Analysis of Solid Materials With the Ion-Microprobe Sputter Source

R.F.K. Herzog, W.P. Poschenrieder, and F.G. Satkiewicz
Format
Book; Government Document; Online; EBook
Published
Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : For sale by the Clearinghouse for Federal Scientific and Technical Information, 1967.
Language
English
Series
NASA Cr
Description
iii, 44 p. : ill. ; 27 cm.
Mode of access: Internet.
Notes
  • "January, 1967." (from cover)
  • Includes bibliographical references.
Series Statement
NASA CR ; 683
Logo for Copyright Not EvaluatedCopyright Not Evaluated
Technical Details

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    a| Mass spectrometer analysis of solid materials with the ion-microprobe sputter source / c| R.F.K. Herzog, W.P. Poschenrieder, and F.G. Satkiewicz.
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    a| Washington, D.C. : b| National Aeronautics and Space Administration ; a| Springfield, Va. : b| For sale by the Clearinghouse for Federal Scientific and Technical Information, c| 1967.
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    a| iii, 44 p. : b| ill. ; c| 27 cm.
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    a| NASA CR ; v| 683
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    a| "January, 1967." (from cover)
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    a| Includes bibliographical references.
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    a| "Prepared under contract no. b| NAS 5-9254 by GCA corporation, Bedforn, Mass. for Goddard Space Flight Center, National Aeronautics and Space Administration."
    538
      
      
    a| Mode of access: Internet.
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    a| Solids.
    650
      
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    a| Materials science.
    650
      
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    a| Microprobe analysis.
    650
      
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    a| Ion sources.
    650
      
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    a| Mass spectrometers.
    700
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    a| Satkiewicz, Frank G.
    700
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    a| Poschenrieder, W. P.
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    a| Goddard Space Flight Center.
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    a| United States. b| National Aeronautics and Space Administration.
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    b| UIU c| UIUC d| 20141113 s| google u| uiug.30112106732701 y| 1967 r| pd q| bib

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