Item Details

Model Reduction by Trimming for a Class of Semi-Markov Reliability Models and the Corresponding Error Bound

Allan L. White and Daniel L. Palumbo
Format
Book; Government Document; Online; EBook
Published
Washington, D.C. : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division ; Springfield, Va. : For sale by the National Technical Information Service, 1991.
Language
English
Series
NASA Technical Paper
Description
8 p. : ill. ; 28 cm.
Mode of access: Internet.
Notes
  • Prepared at Langley Research Center.
  • Bibliography: p. 8.
Series Statement
NASA technical paper ; 3089
Logo for Copyright Not EvaluatedCopyright Not Evaluated
Technical Details

  • LEADER 01585nam a2200397Ia 4500
    001 011423859
    003 MiAaHDL
    005 20141013010000.0
    006 m d
    007 cr bn ---auaua
    008 910612s1991 dcua b f000 0 eng d
    035
      
      
    a| sdr-uiuc6354263
    035
      
      
    a| (OCoLC)23925438
    040
      
      
    a| ABC c| ABC
    049
      
      
    a| UIUU
    050
      
    4
    a| TL521.3 b| .N18 no. 3089
    100
    1
      
    a| White, Allan L.
    245
    1
    0
    a| Model reduction by trimming for a class of semi-Markov reliability models and the corresponding error bound / c| Allan L. White and Daniel L. Palumbo.
    260
      
      
    a| Washington, D.C. : b| National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division ; a| Springfield, Va. : b| For sale by the National Technical Information Service, c| 1991.
    300
      
      
    a| 8 p. : b| ill. ; c| 28 cm.
    490
      
    0
    a| NASA technical paper ; v| 3089
    500
      
      
    a| Prepared at Langley Research Center.
    504
      
      
    a| Bibliography: p. 8.
    538
      
      
    a| Mode of access: Internet.
    650
      
    0
    a| Palumbo, Daniel L.
    650
      
    0
    a| Markov processes.
    650
      
    0
    a| Reliability (Engineering) x| Computer simulation.
    710
    2
      
    a| Langley Research Center.
    974
      
      
    b| UIU c| UIUC d| 20141113 s| google u| uiug.30112106711101 y| 1991 r| pd q| bib

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