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Trap Level Spectroscopy in Amorphous Semiconductors

Viktor I. Mikla and Victor V. Mikla
Format
Book
Published
Amsterdam ; Boston : Elsevier, 2010.
Edition
1st ed
Language
English
Series
Elsevier Insights
ISBN
9780123847157 (hbk.), 012384715X (hbk.)
Description
vi, 120 p. : ill. ; 24 cm.
Notes
Includes bibliographical references.
Technical Details
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    a| Amorphous semiconductors x| Spectra.
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    a| Amorphous semiconductors x| Defects x| Analysis.
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    a| Deep level transient spectroscopy.
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